Researchers use computer imaging for early detection of blight on wheat

Researchers use computer imaging for earlier detection of blight on wheat. With the use of computer imaging and mask region convolutional neural network (Mask-RCNN), researchers, including BBE assistant professor Ce Yang, have been able to detect the fungus disease of Fusarium head blight (FHB) with more rapid recognition and greater accuracy. This study shows that rapid detection of FHB in wheat spikes could lead to breeding resistant cultivars.